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Enxense is presenting a patented novel X-ray spectroscopy & imaging technology with features like:
- Extremely high count rate per square mm
- Upholding the count rate per square mm independent of detection area
- Upholding the energy-resolution independent of detection area
- Lean cooling requirements
- Suitable for sensor material made of both Silicon and CdTe/CZT
- Potential for full-field XRF imaging
- Potential for one-piece large surface detectors, 400mm2 and above
- Potential for use as XRD/XRF combined detector